Publications

Sachse R, Moor M, Kraehnert R, Hodoroaba V-D, Hertwig A. “Ellipsometry-Based Approach for the Characterization of Mesoporous Thin Films for H2 Technologies”, Adv. Engin. Mat. (2022) 24 (6):2101320. https://doi.org/10.1002/adem.202101320
Ciesielski R, Saadeh Q, Philipsen V, Opsomer K, Soulié J-P, Wu M, Naujok P, van de Kruijs R W E, Detavernier C, Kolbe M, Scholze F, Soltwisch V. “Determination of optical constants of thin films in the EUV”, Applied Optics (2022) 61(8):2060-2078. https://doi.org/10.1364/AO.447152
Ossikovski R and Arteaga O “Optical response of media and structures exhibiting spatial dispersions”, Optics Letters (2022) 47, 5602-5605. https://doi.org/10.1364/OL.475069
Ossikovski R, Artega O, Garcia-Caurel E and Hingerl K, "Model for the depolarizing retarder in Mueller matrix polarimetry," J. Opt. Soc. Am. A (2022) 39, 873-882. https://doi.org/10.1364/JOSAA.451106
Plock M, Anderle K, Burger S and Schneider P-I, “Bayesian Target-Vector Optimization of Efficient Parameter Reconstruction” Adv. Theory and Simulations (2022) 5 (10) 2200112. https://doi.org/10.1002/adts.202200112