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Advanced Traceable Metrology

for Optical Constants

Next generation materials and ultra-thin films with tailored optical properties for integrated circuits will rely on innovations in nanotechnologies. Knowledge of their properties is key for innovations based on size-dependent material parameters with an increasing importance placed on quantum effects. Photonic measurement methods in the soft-X ray to IR wavelength range that approach theoretical limits need better traceability coupled with rigorous uncertainty estimations to provide the tools needed to characterise novel optical materials. Whilst the mathematical modelling approaches these rely on require improvement to increase technique applicability.